| Bibtype | Inproceedings |
|---|---|
| Bibkey | Saadallah/etal/2022a |
| Author | Saadallah, Amal and Büscher, Jan and Abdulaaty, Omar and Panusch,Thorben and Deuse,Jochen and Morik, Katharina |
| Title | Explainable Predictive Quality Inspection using Deep Learning in Electronics Manufacturing |
| Booktitle | 55th {CIRP} conference on Manufacturing Systems |
| Publisher | Elsevier |
| Year | 2022 |
| Projekt | SFB876-B3 |
| Bibtex | Here you can get this literature entry as BibTeX format. |
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