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Yayla/etal/2022a: Reliable Binarized Neural Networks on Unreliable Beyond von-Neumann Architecture

Bibtype Article
Bibkey Yayla/etal/2022a
Author Mikail Yayla and Simon Thomann and Sebastian Buschjäger and Katharina Morik and Jian-Jia Chen and Hussam Amrouch
Title Reliable Binarized Neural Networks on Unreliable Beyond von-Neumann Architecture
Journal IEEE Transactions on Circuits and Systems I
Year 2022
Projekt SFB876-A1
Url https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9732897
 
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